An optimal method for testing digital to analog converters

Author

Fasang, Patrick P.

Author_Institution

Hitachi America Ltd., Brisbane, CA, USA

fYear

1997

fDate

7-10 Sep 1997

Firstpage

42

Lastpage

46

Abstract

An optimal method for testing a type of 8-bit digital to analog converters is presented. The method uses 89 out of 256 test vectors. The method for selecting the 89 vectors is explained. It is also pointed out that digital to analog converters of the type described in this paper are tested with 100% fault coverage with the 89 vectors. In addition, the 89 vectors also test for simultaneously switching errors (noise induced errors) and differential linearity. A discussion on the type of code which is used for designing this type of digital to analog converters which renders optimal testing (with 89 vectors) is included

Keywords

application specific integrated circuits; automatic testing; digital-analogue conversion; integrated circuit testing; ASIC embedded DACs; D/A convertors; DAC testing; differential linearity; digital to analog converters; noise induced errors; optimal test method; simultaneously switching errors; Application specific integrated circuits; Digital-analog conversion; Linearity; Logic; Observability; Solids; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International

Conference_Location

Portland, OR

ISSN

1063-0988

Print_ISBN

0-7803-4283-6

Type

conf

DOI

10.1109/ASIC.1997.616975

Filename

616975