DocumentCode :
3545195
Title :
Electrical and optical on-chip interconnects in scaled microprocessors
Author :
Chen, Guoqing ; Chen, Hui ; Haurylau, Mikhail ; Nelson, Nicholas ; Albonesi, David ; Fauchet, Philippe M. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, NY, USA
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
2514
Abstract :
The interconnect has become a primary bottleneck in integrated circuit design. As CMOS technology is scaled, it will become increasingly difficult for conventional copper interconnect to satisfy the design requirements of delay, power, bandwidth, and noise. On-chip optical interconnect is therefore being considered as a potential substitute for electrical interconnect. Based on predictions of optical device development, electrical and optical interconnects are compared for various design criteria. The critical dimensions beyond which optical interconnect becomes advantageous over electrical interconnect at the 22 nm technology node are approximately one tenth of the chip edge length.
Keywords :
CMOS integrated circuits; integrated circuit interconnections; microprocessor chips; optical interconnections; 22 nm; CMOS technology scaling; electrical on-chip interconnects; optical device development; optical interconnect critical dimensions; optical on-chip interconnects; scaled microprocessors; Bandwidth; CMOS technology; Copper; Delay; Integrated circuit interconnections; Integrated circuit synthesis; Integrated circuit technology; Microprocessors; Optical interconnections; Optical noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1465137
Filename :
1465137
Link To Document :
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