• DocumentCode
    3546112
  • Title

    A novel post-nonlinear ICA-based reflectance model for 3D surface reconstruction

  • Author

    Cheng, Wen-Chang ; Lin, Chin-Teng

  • Author_Institution
    Dept. of Inf. Network Technol., Hsiuping Inst. of Technol., Taichung, Taiwan
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    3023
  • Abstract
    We propose a novel reflectance model for photometric stereo. It consists of diffuse components and specular components. Unlike past methods, ours does not need to separate the two components from the nonlinear reflection model. We use an unsupervised learning adaptation algorithm to estimate the reflectance model based on image intensities. First, the technique of the post-nonlinear independent components analysis (ICA) model is used to obtain the surface normal on each point of an image. Then, the 3D surface model can be reconstructed based on the estimated surface normal on each point of the image by using the method of enforcing integrability. We test our algorithm on synthetically generated images for the reconstruction of the surface of objects and on a number of real images from the Vale Face Database B. The results clearly indicate the superiority of the proposed nonlinear reflectance model over the Georghiades approach and the Hayakawa approach.
  • Keywords
    image reconstruction; independent component analysis; light reflection; reflectivity; solid modelling; stereo image processing; 3D surface reconstruction; diffuse components; enforcing integrability method; image intensities; nonlinear reflection model; photometric stereo; post-nonlinear ICA-based reflectance model; post-nonlinear independent components analysis model; specular components; surface normal; unsupervised learning adaptation algorithm; Image reconstruction; Independent component analysis; Light sources; Optical reflection; Photometry; Reflectivity; Rough surfaces; Surface reconstruction; Surface roughness; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465264
  • Filename
    1465264