Title :
Uncertainty quantification and sensitivity analysis of backlit x-ray radiographs
Author :
Fein, Jeffrey R. ; Holloway, James P. ; Kuranz, Carolyn C.
Author_Institution :
Center for Radiative Shock Hydrodynamics (CRASH), Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Summary form only given. Current feature extraction from mono-energetic backlit radiography for HED physics experiments lacks rigorous uncertainty quantification and sensitivity analysis. We present a method to determine uncertainty bounds of source intensity, background and attenuation coefficient in the mono-energetic case, through propagating known experimental uncertainties through a numerical fit. Comparing the fit-retrieved absorption coefficient to the nominal value presents a method to validate the mono-energetic photon transport model for these radiographs. A preliminary sensitivity analysis shows that source uniformity, as well as a background x-ray spectrum might be significant. This is supported by previous experiments that have measured a high-energy source likely due to hot electrons producing bremsstrahlung or K-α emission in the Ta shield.
Keywords :
X-ray apparatus; X-ray spectra; feature extraction; hot carriers; numerical analysis; photon transport theory; radiography; sensitivity analysis; HED physics experiments; K-alpha emission; Ta shield; background x-ray spectrum; bremsstrahlung emission; experimental uncertainties; fit-retrieved absorption coefficient; high-energy source; hot electrons; monoenergetic backlit radiography; monoenergetic photon transport model; numerical fit; sensitivity analysis; source intensity; Computer crashes; Educational institutions; Electric shock; Hydrodynamics; Radiography; Sensitivity analysis; Uncertainty;
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/PLASMA.2013.6633438