Title :
A decoder-based switch box to mitigate soft errors in SRAM-based FPGAs
Author :
Ebrahimi, Hassan ; Zamani, Morteza Saheb ; Zarandi, Hamid R.
Author_Institution :
Dept. of Comput. Eng., Amirkabir Univ. of Technol., Tehran, Iran
Abstract :
This paper proposes a new switch box architecture in SRAM-based FPGAs to mitigate soft error effects. In this switch box architecture, the number of SRAM bits required for programming switch box is reduced to 67% without any impact on routing capability of the switch box. This architecture does not require any modification of the existing placement and routing algorithms. The architecture was evaluated based on several MCNC benchmarks using VPR tool. The experimental results show that this architecture decreases the susceptibility of switch boxes to SEUs about 20% on average compared to the traditional ones.
Keywords :
SRAM chips; field programmable gate arrays; integrated circuit reliability; network routing; radiation hardening (electronics); MCNC benchmarks; SRAM-based field programmable gate arrays; VPR tool; decoder-based switch box; routing capability; single event upset; soft error effects; Decoding; Field programmable gate arrays; Logic devices; Pins; Programmable logic arrays; Routing; Single event transient; Single event upset; Switches; Wire;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419688