DocumentCode :
3546462
Title :
Fabrication of force sensitive penetrating electrical neuroprobe arrays
Author :
Morita, Shogo ; Fujishiro, Akifumi ; Ikedo, Akihito ; Ishida, Makoto ; Kawano, Takeshi
Author_Institution :
Dept. of Electr. & Electron. Inf. Eng., Toyohashi Univ. of Technol., Toyohashi, Japan
fYear :
2012
fDate :
Jan. 29 2012-Feb. 2 2012
Firstpage :
243
Lastpage :
246
Abstract :
MEMS-based penetrating micro-scale probe electrodes have been used in numerous electrophysiological measurements. However, it is necessary to quantitatively study probe-induced stress on the tissue/neurons and the damage during the probe penetration. Here we propose a vertically-aligned electrical recording neuroprobe array each with the force detection capability during the probe penetration into biological samples (Fig. 1). We fabricated the force sensitive probe array based on piezoresistive p-type silicon probes (~0.9 Ω·cm) with the length of 60 μm and the diameter of 5 μm. The p-type silicon probe array was vertically assembled over an n-type silicon island by using in-situ doping vapor-liquid-solid (VLS) growth technology. Each probe has two terminal interconnections at the tip and the base formed by three-dimensional metallization process. The probe resistance for the piezoresistance effect in silicon was confirmed by measuring the current-voltage characteristics of vertically assembled individual probes. During the probe penetration, the probe array can also be used for multi-site electrical recordings of neural activities via Pt-black electrodes at probe-tips with a low impedance of 14 KΩ at 1 kHz.
Keywords :
metallisation; micromechanical devices; neural chips; probes; 3D metallization process; MEMS-based penetrating micro-scale probe electrodes; biological sample; current-voltage characteristics; doping vapor-liquid-solid growth technology; electrical recording neuroprobe array; electrophysiological measurement; force detection capability; force sensitive penetrating electrical neuroprobe arrays; force sensitive probe array; multisite electrical recordings; neural activity; piezoresistance effect; piezoresistive p-type silicon probe; probe penetration; probe resistance; probe-induced stress; tissue/neurons; Current measurement; Electrodes; Force; Impedance; Piezoresistance; Probes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location :
Paris
ISSN :
1084-6999
Print_ISBN :
978-1-4673-0324-8
Type :
conf
DOI :
10.1109/MEMSYS.2012.6170136
Filename :
6170136
Link To Document :
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