• DocumentCode
    3546510
  • Title

    Simulation of the nonlinearity in clumped-clumped beam MEMS resonator

  • Author

    JunWen Jiang ; Jingfu Bao ; Yijia Du

  • Author_Institution
    Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    1
  • fYear
    2013
  • fDate
    15-17 Nov. 2013
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    It is important to study the nonlinearity of MEMS resonators since it affects the performance of the resonators as well as filters and oscillators constructed by them. Based on the equivalent circuit model, the nonlinearity, especially the A-f effect of a Clumped-clumped (C-C) beam MEMS resonator is studied in this research. The established model and simulation procedure enables us to reveal the resonance frequency and amplitude of the electrostatic MEMS resonator under relatively small displacement of the beam. The circuit model is built with mechanical solution and F-V analogy. What´s more, an iterative program is used in this study to depict the A-f effect. The results reveals the change of the output current with frequency response curves by varying the DC bias voltage, the ac excitation voltage and the gap size.
  • Keywords
    MMIC oscillators; electrostatic devices; equivalent circuits; frequency response; micromechanical resonators; microwave filters; microwave resonators; A-f effect; AC excitation voltage variation; DC bias voltage variation; F-V analogy; amplitude; clumped-clumped beam MEMS resonator; electrostatic MEMS resonator; equivalent circuit model; filters; frequency response curves; gap size variation; iterative program; nonlinearity simulation; oscillators; resonance frequency; Equivalent circuits; Frequency response; Integrated circuit modeling; Mathematical model; Micromechanical devices; Q-factor; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems (ICCCAS), 2013 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4799-3050-0
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2013.6765252
  • Filename
    6765252