DocumentCode :
3546606
Title :
A CMOS capacitance sensor for cell adhesion characterization
Author :
Prakash, Somashekar Bangalore ; Abshire, Pamela ; Urdaneta, Mario ; Smela, Elisabeth
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
3495
Abstract :
We describe a CMOS capacitance sensor for measuring the capacitive coupling between living cells and the underlying substrate, a quantity that can be used to characterize cell adhesion strength and cell health. The capacitance sensor operates on the charge sharing principle, mapping sensed capacitance values to voltages. The sensor has been fabricated in a commercially available 0.5 μm, 2-poly 3-metal CMOS technology. Experimental results are presented for bench tests using a micropositioned electrode and in vitro tests with cells cultured directly on the chip surface. The sensor achieves an empirical distance resolution of 3 nm and capacitance resolution of 135 aF. The sensors have been successfully used for long term monitoring of cell viability in vitro.
Keywords :
CMOS integrated circuits; biosensors; capacitance measurement; micropositioning; 0.5 micron; CMOS capacitance sensor; bench tests; capacitance resolution; capacitive coupling; cell adhesion characterization; cell health; cell viability; charge sharing principle; empirical distance resolution; in vitro tests; living cells; long term monitoring; micropositioned electrode; underlying substrate; Adhesives; CMOS technology; Capacitance measurement; Capacitive sensors; Cells (biology); Electrodes; In vitro; Sensor phenomena and characterization; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1465382
Filename :
1465382
Link To Document :
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