Title :
Process, voltage and temperature compensation of off-chip-driver circuits for sub-0.25-μm CMOS technology
Author :
Chi, Hua ; Stout, Douglas ; Chickanosky, John
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
Abstract :
A control circuit that compensates for variations in process, voltage and temperature (PVT) has been developed to control off-chip-driver circuits used for sub-0.25-μm technology. The off-chip-driver (OCD), alone with a simple control scheme, delivers a tight impedance tolerance at the output, improving the output signal waveforms. Across-chip length variation (ACLV), the controlled-circuit design and off-chip-driver performance are also discussed
Keywords :
CMOS digital integrated circuits; application specific integrated circuits; compensation; driver circuits; 0.25 micron; control circuit; off-chip driver circuits; offchip drivers; process compensation; submicron CMOS technology; temperature compensation; voltage compensation; CMOS process; CMOS technology; Clocks; Impedance; MOSFET circuits; Microelectronics; Resistors; Rivers; Temperature control; Voltage control;
Conference_Titel :
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-4283-6
DOI :
10.1109/ASIC.1997.617021
