DocumentCode
3546809
Title
Behavioral modeling and testing of a CMOS-MEMS parametric resonator governed by the nonlinear Mathieu equation
Author
Guo, Congzhong ; Fedder, Gary K.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2012
fDate
Jan. 29 2012-Feb. 2 2012
Firstpage
535
Lastpage
538
Abstract
Modeling and simulation of complex phenomena in environments that emulate end applications demonstrate the effectiveness of MEMS composable design methodologies. A CMOS-MEMS nonlinear resonator featuring parametric excitation driven by an oscillating voltage applied across the non-interdigitated comb fingers has been targeted as a demonstration vehicle. This paper reports the schematic-based parameterized behavioral modeling and vibration testbed of parametric resonators governed by the nonlinear Mathieu equation. The linear and cubic stiffness of the electrostatic force and the folded flexure are modeled by Verilog-A MEMS behavioral models. The transition frequencies and the jump amplitudes are characterized optically by sweeping the frequency bi-directionally. The observed parametric resonance, occurring near excitation frequency of twice the resonant frequency, is verified by perturbation solution of Mathieu equation, and validated by circuit-level behavioral model simulation matching to 0.6%. The dynamic behavior and its dependence on system parameters are also analyzed.
Keywords
CMOS integrated circuits; micromechanical resonators; CMOS MEMS parametric resonator; behavioral modeling; behavioral testing; nonlinear Mathieu equation; nonlinear resonator; parametric resonance; Analytical models; Electrostatics; Fingers; Force; Frequency measurement; Mathematical model; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location
Paris
ISSN
1084-6999
Print_ISBN
978-1-4673-0324-8
Type
conf
DOI
10.1109/MEMSYS.2012.6170233
Filename
6170233
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