• DocumentCode
    3546809
  • Title

    Behavioral modeling and testing of a CMOS-MEMS parametric resonator governed by the nonlinear Mathieu equation

  • Author

    Guo, Congzhong ; Fedder, Gary K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2012
  • fDate
    Jan. 29 2012-Feb. 2 2012
  • Firstpage
    535
  • Lastpage
    538
  • Abstract
    Modeling and simulation of complex phenomena in environments that emulate end applications demonstrate the effectiveness of MEMS composable design methodologies. A CMOS-MEMS nonlinear resonator featuring parametric excitation driven by an oscillating voltage applied across the non-interdigitated comb fingers has been targeted as a demonstration vehicle. This paper reports the schematic-based parameterized behavioral modeling and vibration testbed of parametric resonators governed by the nonlinear Mathieu equation. The linear and cubic stiffness of the electrostatic force and the folded flexure are modeled by Verilog-A MEMS behavioral models. The transition frequencies and the jump amplitudes are characterized optically by sweeping the frequency bi-directionally. The observed parametric resonance, occurring near excitation frequency of twice the resonant frequency, is verified by perturbation solution of Mathieu equation, and validated by circuit-level behavioral model simulation matching to 0.6%. The dynamic behavior and its dependence on system parameters are also analyzed.
  • Keywords
    CMOS integrated circuits; micromechanical resonators; CMOS MEMS parametric resonator; behavioral modeling; behavioral testing; nonlinear Mathieu equation; nonlinear resonator; parametric resonance; Analytical models; Electrostatics; Fingers; Force; Frequency measurement; Mathematical model; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
  • Conference_Location
    Paris
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4673-0324-8
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2012.6170233
  • Filename
    6170233