DocumentCode
3546824
Title
Experimental and modeling analysis on entrainment condition of submicrometer thick Si micro mechanical resonators with nonlinear coupling element
Author
Tanno, Keitaro ; Kawai, Yusuke ; Ono, Takahito
Author_Institution
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear
2012
fDate
Jan. 29 2012-Feb. 2 2012
Firstpage
563
Lastpage
566
Abstract
In this paper, the synchronization of coupled resonators is investigated. Mechanically coupled three resonators are fabricated, and the synchronized condition of these resonators is evaluated. When the frequency of external driving force approaches to the lowest resonant frequency of the coupled resonators, the entrainment of resonance occurred in other resonators, where the frequency ratios become integer and their phase differences are locked. Moreover, the width of the entrainment region is dependent on the amplitude of resonators. Using a basic physical model of the coupled three resonators, we estimated the coupling springs, which show a strong nonlinearity.
Keywords
elemental semiconductors; micromechanical resonators; silicon; synchronisation; Si; coupled resonator synchronization; coupling springs; entrainment condition; external driving force approach; nonlinear coupling element; physical model; submicrometer thick micromechanical resonators; Couplings; Frequency measurement; Optical resonators; Resonant frequency; Springs; Synchronization; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
Conference_Location
Paris
ISSN
1084-6999
Print_ISBN
978-1-4673-0324-8
Type
conf
DOI
10.1109/MEMSYS.2012.6170238
Filename
6170238
Link To Document