• DocumentCode
    3546824
  • Title

    Experimental and modeling analysis on entrainment condition of submicrometer thick Si micro mechanical resonators with nonlinear coupling element

  • Author

    Tanno, Keitaro ; Kawai, Yusuke ; Ono, Takahito

  • Author_Institution
    Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
  • fYear
    2012
  • fDate
    Jan. 29 2012-Feb. 2 2012
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    In this paper, the synchronization of coupled resonators is investigated. Mechanically coupled three resonators are fabricated, and the synchronized condition of these resonators is evaluated. When the frequency of external driving force approaches to the lowest resonant frequency of the coupled resonators, the entrainment of resonance occurred in other resonators, where the frequency ratios become integer and their phase differences are locked. Moreover, the width of the entrainment region is dependent on the amplitude of resonators. Using a basic physical model of the coupled three resonators, we estimated the coupling springs, which show a strong nonlinearity.
  • Keywords
    elemental semiconductors; micromechanical resonators; silicon; synchronisation; Si; coupled resonator synchronization; coupling springs; entrainment condition; external driving force approach; nonlinear coupling element; physical model; submicrometer thick micromechanical resonators; Couplings; Frequency measurement; Optical resonators; Resonant frequency; Springs; Synchronization; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2012 IEEE 25th International Conference on
  • Conference_Location
    Paris
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4673-0324-8
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2012.6170238
  • Filename
    6170238