Multilayer optical storage using low-coherence reflectometry

Author

Chinn, S.R. ; Swanson, E.A.

Author_Institution

Lincoln Lab., MIT, Lexington, MA, USA

fYear

1996

fDate

2-7 June 1996

Firstpage

101

Lastpage

102

Abstract

Summary form only given. Optical coherence domain reflectometry (OCDR) is capable of high-resolution imaging inside partially transparent media. Its high sensitivity with good lateral and depth resolution make this technique an excellent candidate for reading optical data stored in closely packed layers. Because diffraction-limited imaging of local regions is used (as opposed to volumetric holography), much of the existing single-layer, direct-detection optical storage technology can be directly adapted.

Keywords

data recording; light coherence; optical films; optical images; optical resolving power; optical storage; optical testing; reflectometry; sensitivity; closely packed layers; depth resolution; diffraction-limited imaging; high sensitivity; high-resolution imaging; lateral resolution; local regions; low-coherence reflectometry; multilayer optical storage; optical coherence domain reflectometry; optical data storage reading; partially transparent media; single-layer direct-detection optical storage technology; volumetric holography; Focusing; Head; Holographic optical components; Holography; Lenses; Nonhomogeneous media; Optical interferometry; Optical mixing; Optical sensors; Reflectometry;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864418