• DocumentCode
    3547060
  • Title

    Test board design and measurement techniques for high-frequency fully-differential CMOS OTAs

  • Author

    Chiang, David Hsiu-Chun ; Schaumann, Rolf ; Daasch, W. Robert

  • Author_Institution
    Dept. of Electr. Eng., Portland State Univ., OR, USA
  • fYear
    1997
  • fDate
    7-10 Sep 1997
  • Firstpage
    321
  • Lastpage
    326
  • Abstract
    Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design
  • Keywords
    CMOS analogue integrated circuits; differential amplifiers; integrated circuit measurement; integrated circuit testing; operational amplifiers; AC parameters; DC parameters; high-frequency fully-differential CMOS OTA; measurement technique; test board design; CMOS technology; Capacitors; Circuit testing; Distortion measurement; Impedance; Measurement techniques; Power measurement; Power supplies; Resistors; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International
  • Conference_Location
    Portland, OR
  • ISSN
    1063-0988
  • Print_ISBN
    0-7803-4283-6
  • Type

    conf

  • DOI
    10.1109/ASIC.1997.617030
  • Filename
    617030
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3547060