DocumentCode
3547388
Title
Large scale computing system EMI test philosophy
Author
Soohoo, Kwok M. ; Wu, Chang-Yu
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
fYear
1997
fDate
21-23 May 1997
Firstpage
1
Lastpage
4
Abstract
The purpose of the paper is to discuss the testing philosophy of large system EMI testing and some of the methods used to reduce the test logistics and complexity; it is also for Regulatory Agents to consider when writing up EMC rules. Actual test data are given to substantiate the rationales behind the test methods
Keywords
computer testing; electromagnetic compatibility; legislation; EMC rules; EMI test philosophy; Regulatory Agents; complexity; large scale computing system; parallel system; scalar system; test data; test logistics; test methods; Electromagnetic compatibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location
Beijing
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ELMAGC.1997.617040
Filename
617040
Link To Document