Title :
Behavioural modeling and simulation of a switched-current phase locked loop
Author :
Wilson, Peter ; Wilcock, Reuben
Author_Institution :
Sch. of Electron. & Comput. Sci., Southampton Univ., UK
Abstract :
Switched-current (SI) methods can provide an effective route to the implementation of analog IC functionality using a standard digital CMOS process. Further, adopting an SI architecture can lead to equivalent performance but with a significantly reduced area compared to switched capacitor structures. The use of behavioural modeling and simulation at a structural and building block level has allowed architectural exploration and evaluation to be carried out on novel topologies based on this approach. The result is an integrated design flow that uses behavioural models to test the performance of the circuit, leading directly to a synthesized structural model that can be verified using a common design platform. This has the obvious benefit of reducing the full custom analog design effort required when developing topologies and building blocks for new processes. We describe the design approach for a phase locked loop (PLL) based on a novel SI architecture using behavioural models written in VHDL-AMS. Simulations demonstrate the performance of the design at a high level and are used to optimize the behaviour of the loop response with regard to design specifications. The modeling approach is explained. The advantage of using behavioural models is highlighted. The resulting simulations are consistent with transistor level simulation results, but several orders of magnitude faster. The resulting design achieves a performance that is comparable with designs using current techniques, but with significantly reduced area.
Keywords :
CMOS analogue integrated circuits; circuit simulation; hardware description languages; integrated circuit design; integrated circuit modelling; network topology; optimisation; phase locked loops; switched current circuits; VHDL-AMS; analog IC functionality; behavioural modeling; integrated design flow; standard digital CMOS process; switched capacitor structures; switched-current phase locked loop; topologies; transistor level simulation; Analog integrated circuits; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS integrated circuits; CMOS process; Capacitors; Circuit testing; Circuit topology; Phase locked loops; Semiconductor device modeling;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1465800