DocumentCode :
3547731
Title :
A physically-derived large-signal nonquasi-static MOSFET model for computer aided device and circuit simulation part-II the CMOS NOR gate and the CMOS NAND gate
Author :
Payton, Michael Walter ; Ho, Fat Duen
Author_Institution :
Dept. of Electr. & Comput. Eng., Alabama Univ., Huntsville, AL, USA
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
5657
Abstract :
The primary goal of this work is to develop a low-level physics-based nonquasi-static MOSFET model that can be extended to the simulation of high-level CMOS logic circuits. In this part of our papers (part II), the results of using our model described in the companion paper (submitted to ibid) to simulate the CMOS NOR gate and NAND gate are presented. The numerical methods discussed in the companion paper are applied in the simulations for the NOR gate and the NAND gate. In addition, a bisection root finding algorithm is used to calculate any junction voltage that appears between two devices connected in series. The results compared well with those obtained from the SPICE level 3 and SPICE level 7 (BSIM 3.1) for a wide range of device geometries and circuit loading conditions. The results show that our model is capable of accurately simulating the transient response of devices with channel lengths as small as 0.33 μm and for switching frequencies approaching 1 GHz.
Keywords :
CMOS logic circuits; MOSFET; logic CAD; logic gates; logic simulation; semiconductor device models; transient response; 0.33 micron; 1 GHz; CMOS NAND gate; CMOS NOR gate; CMOS logic circuits; bisection root finding algorithm; circuit loading conditions; computer aided circuit simulation; computer aided device simulation; device geometry; nonquasi-static MOSFET model; physically-derived large-signal MOSFET model; physics-based model; series connected device junction voltage; transient response; CMOS logic circuits; Circuit simulation; Computational modeling; Geometry; MOSFET circuits; Physics computing; SPICE; Semiconductor device modeling; Transient response; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1465921
Filename :
1465921
Link To Document :
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