TSUNAMI: a path oriented scheme for algebraic test generation

An algorithm is presented for generating tests for single stuck line faults using a combination of algebraic processing and conventional path oriented search. Unlike conventional test generation algorithms, this algorithm uses algebraic methods to determine the complete set of input assignments that will propagate an error signal through a gate in a path to a primary output. The algorithm uses ordered binary decision diagrams (BDDs) for algebraic processing. For a large number of circuits that are amenable to analysis using BDDs, the algorithm is faster than previous algebraic methods. The algorithm has been implemented as the program TSUNAMI. Experimental results demonstrate that for most circuits TSUNAMI can generate test sets for all faults in fairly small amounts of time and is very efficient for hard-to-detect and redundant faults. Moreover, since a large set of tests is generated for each fault, these sets can be compacted to a very high degree. Using benchmark circuits as a reference, TSUNAMI obtains test sets up to 70% smaller than test sets generated by conventional algorithms.<>