• DocumentCode
    3548435
  • Title

    Using loop invariants to fight soft errors in data caches

  • Author

    Krishna, N. Sri Hari ; Son, Seung Woo ; Kandemir, Mahmut ; Li, Feihui

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., USA
  • Volume
    2
  • fYear
    2005
  • fDate
    18-21 Jan. 2005
  • Firstpage
    1317
  • Abstract
    Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicating instructions either in the spatial or temporal domain and then comparing the results to see whether they are different. This full duplication based scheme, though effective, is very expensive in terms of performance, power, and memory space. In this paper, we propose an alternate scheme based on loop invariants and present experimental results which show that our approach catches 62% of the errors caught by full duplication, when averaged over all benchmarks tested. In addition, it reduces the execution cycles and memory demand of the full duplication strategy by 80% and 4%, respectively.
  • Keywords
    cache storage; electronic engineering computing; embedded systems; error detection; fault diagnosis; integrated circuit reliability; logic testing; program compilers; software fault tolerance; data caches; embedded systems; full duplication based scheme; loop invariants; scaling process technology; soft errors; Benchmark testing; Computer errors; Computer science; Embedded system; Error correction; Hardware; Logic devices; Semiconductor devices; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
  • Print_ISBN
    0-7803-8736-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2005.1466586
  • Filename
    1466586