DocumentCode :
354846
Title :
Field-enhanced picosecond diffraction efficiency of a photorefractive multiple quantum well device
Author :
Canoglu, E. ; Mahgerefteh, D. ; Ching-Mei Yang ; Garmire, E. ; Partovi, Alireza ; Chiu, T.H. ; Glass, A.M. ; Zydzik, G.J.
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
fYear :
1996
fDate :
2-7 June 1996
Firstpage :
214
Abstract :
Summary form only given. Satisfying the fast turn-on time and high sensitivity requirements, photorefractive multiple quantum well (MQW) devices have become the candidate for real-time holographic applications. The diffraction efficiency of the present devices decreases with the grating spacing much faster than the theoretically calculated. In order to understand the charge transport process that reduces the resolution, we have measured the picosecond response time of diffraction gratings. The grating build-up processes and the diffraction efficiency as a function of grating period have been presented in an earlier conference. In this work, we investigate the picosecond effects of applied field on diffraction efficiency in GaAs MQWs.
Keywords :
III-V semiconductors; gallium arsenide; high-speed optical techniques; holographic gratings; multiwave mixing; photorefractive materials; quantum confined Stark effect; semiconductor quantum wells; charge transport process; diffraction efficiency; diffraction gratings; fast turn-on time; field-enhanced picosecond diffraction efficiency; grating build-up processes; grating period; grating spacing; high sensitivity requirements; photorefractive multiple quantum well device; picosecond effects; picosecond response time; real-time holographic applications; resolution; Charge measurement; Current measurement; Delay; Diffraction gratings; Gallium arsenide; Holography; Photorefractive effect; Photorefractive materials; Quantum well devices; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
Type :
conf
Filename :
864579
Link To Document :
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