• DocumentCode
    3548618
  • Title

    Photoluminescence investigation of p-to-n conversion in CdTe by annealing in Cd atmosphere

  • Author

    Horodyský, P. ; Belas, E. ; Franc, J. ; Grill, R. ; Hlídek, P. ; Tóth, A.L.

  • Author_Institution
    Inst. of Phys., Charles Univ., Prague
  • Volume
    7
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    4478
  • Lastpage
    4480
  • Abstract
    The p-to-n conversion of CdTe single crystals caused by low temperature annealing in cadmium atmosphere is investigated by photoluminescence (PL), electron beam induced current method (EBIC) and galvanomagnetic measurements. We show that PL of excitons bound to silver, copper and sodium neutral acceptors in the converted n-type exhibits drastic reduction (about three orders of magnitude) comparing to unconverted p-type or as grown crystal. Simultaneously, we observe that cadmium substitutional acceptors diffuse fast interstitially into remaining p-type, where they recombine with Cd vacancies and accumulate in the sample core. Concentration of donors is only slightly modified. This effect has a potential application in preparation of pure n-type CdTe samples
  • Keywords
    EBIC; annealing; excitons; impurity states; photoluminescence; vacancies (crystal); Cd vacancies; CdTe single crystals; EBIC; cadmium atmosphere; converted n-type; copper neutral acceptors; donor concentration; electron beam induced current method; excitons; galvanomagnetic measurements; low temperature annealing; p-to-n conversion; photoluminescence; pure n-type CdTe samples; silver neutral acceptors; sodium neutral acceptors; unconverted p-type; Annealing; Atmosphere; Atmospheric measurements; Cadmium; Crystals; Current measurement; Electron beams; Excitons; Photoluminescence; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • Conference_Location
    Rome
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1466879
  • Filename
    1466879