DocumentCode
3548637
Title
Investigation of spectral response of monolithic CZT for imaging
Author
Blevis, I.M. ; Pansky, A. ; Altman, H. ; Hugg, J.W. ; Tsigelman, A.
Author_Institution
GE Healthcare, Haifa, Israel
Volume
7
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
4556
Abstract
Monolithic CZT with multiple anode pads and a common cathode has been used in a number of gamma camera prototypes. The pixelation of the anode pads has been shown to result in high intrinsic resolution that in turn has been shown to yield advantages in both close subject planar imaging and in Single Photon Emission Computed Tomography. A major problem in the way of commercialization of the technology is the spectral response of the semiconductor. It shows a significant loss of detected events from the full energy peak and thus there is unrealized potential for a further improved image quality. This spectrum degradation is caused by a variety of loss mechanisms arising principally from reduced hole mobility and hole trapping. Gamma-ray interactions in regions close to the anodes and in regions between the anode pads (´roads´) both contribute significantly but in unknown relative amounts to a slow signal component and a resultant ballistic deficit. To separate the relative contributions and understand further the control variables we have studied the spectral response of monolithic detector samples of different thickness. A strong dependence of the spectral peak-to-tail ratio on the thickness was found, while at the same time the peak width changed consistently.
Keywords
gamma-ray detection; semiconductor counters; single photon emission computed tomography; Single Photon Emission Computed Tomography; cathode; gamma camera prototypes; gamma-ray interactions; hole trapping; intrinsic resolution; monolithic CZT detector; monolithic detector; multiple anode pads; pixelation; reduced hole mobility; spectrum degradation; Anodes; Cameras; Cathodes; Commercialization; High-resolution imaging; Image resolution; Optical imaging; Pixel; Prototypes; Single photon emission computed tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1466897
Filename
1466897
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