Near-infrared semiconductor lasers for gas analysis operating in the 2-/spl mu/m range

Author

Sandstrom, L. ; Ahlberg, H. ; Hojer, S. ; Larsson, A.G. ; Backstrom, S.

Author_Institution

Dept. of Optoelectron. & Electr. Meas., Chalmers Univ. of Technol., Goteborg, Sweden

fYear

1996

fDate

2-7 June 1996

Firstpage

239

Lastpage

240

Abstract

Summary form only given. Gas monitoring applications using semiconductor lasers, operating in the 0.7-2.0 /spl mu/m near-infrared (NIR) wavelength region, is a fast growing area with large potential. We will present semiconductor laser measurements of ammonia and carbon dioxide in the 2-/spl mu/m wavelength region, using the wavelength modulation spectroscopy (WMS) technique. Estimations of the improved detection limits and the problems with interfering absorption lines will be discussed.

Keywords

chemical variables measurement; gas sensors; infrared detectors; infrared spectroscopy; modulation spectroscopy; monitoring; semiconductor lasers; spectrochemical analysis; /spl mu/m wavelength region; 0.7 to 2 mum; CO/sub 2/; NH/sub 3/; ammonia; carbon dioxide; detection limits; gas analysis; gas monitoring applications; interfering absorption lines; near-infrared semiconductor lasers; semiconductor laser measurements; wavelength modulation spectroscopy; Absorption; Detectors; Frequency modulation; Gas lasers; Light scattering; Particle scattering; Semiconductor lasers; Signal generators; Speckle; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864613