Characterization of domain-inverted structures in quasi-phase-matched devices by the SHG microscope

Summary form only given. Although the domain structure is a key component in the devices, destructive etching has been a main technique for observing domains. We have recently constructed a second-harmonic-generation microscope (SHGM) and applied it to the nondestructive domain characterization. We report here new application to a Z cut QPM device with different crystal orientation and evaluation of the periodicity using Fourier transformation of SH pictures.