Title :
Robust closed-loop process identification from step test
Author :
Cai, Wen-Jian ; Fang, Yue ; Wang, Ya-gang
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
In this paper, a new identification technique for single-input single-output closed-loop processes from step test in the frequency domain is proposed. The method can identify multiple points on process frequency response over the important frequency range of interest. Consequently, an accurate transfer function can be obtained directly by matching the model in the frequency domain. Such a method is applicable to closed-loop with pre-tuned controller and can be used for on-line tuning of PID controllers. The applications on various typical processes have been employed to show both effectiveness and practicality of the method.
Keywords :
closed loop systems; frequency response; frequency-domain analysis; manufacturing processes; transfer functions; PID controllers; accurate transfer function; frequency domain; online tuning; pretuned controller; process frequency response; robust closed-loop process identification; single-input single-output closed-loop processes; step test; Automatic control; Control systems; Electrical equipment industry; Frequency domain analysis; Frequency response; Industrial control; Process control; Robustness; Testing; Three-term control;
Conference_Titel :
Control, Automation, Robotics and Vision Conference, 2004. ICARCV 2004 8th
Print_ISBN :
0-7803-8653-1
DOI :
10.1109/ICARCV.2004.1468961