DocumentCode :
3549708
Title :
RC-triggered PNP and NPN simultaneously switched silicon controlled rectifier ESD networks for sub-0.18μm technology
Author :
Tan, Pee-Ya ; Indrajit, Manna ; Li, Pian-Hong ; Voldman, Steven H.
Author_Institution :
Chartered Semicond. Mfg. Ltd., Singapore
fYear :
2005
fDate :
27 June-1 July 2005
Firstpage :
71
Lastpage :
75
Abstract :
Silicon controlled rectifiers (SCRs) have superior ESD performance and are expected to play a major role in sub-μm technologies replacing MOSFET-based ESD networks due to MOSFET dielectric scaling. In this paper, novel polysilicon-bound SCR-based clamp circuit is explored that provide simultaneous triggering of NPN and PNP bipolar transistors by means of RC discriminator network and a triggering circuit stages coupled into the regenerative feedback loop of the SCR. This network demonstrates good ESD performance, low on-resistance, high It2 and low holding voltage.
Keywords :
RC circuits; bipolar transistors; discriminators; electrostatic discharge; thyristors; trigger circuits; 0.18 micron; ESD network; MOSFET dielectric scaling; NPN bipolar transistor; PNP bipolar transistor; RC discriminator network; SCR-based clamp circuit; electrostatic discharge; regenerative feedback loop; silicon controlled rectifier; sub-μm technology; triggering circuit; Bipolar transistors; Clamps; Coupling circuits; Dielectrics; Electrostatic discharge; Feedback circuits; Feedback loop; Low voltage; MOSFET circuits; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the
Print_ISBN :
0-7803-9301-5
Type :
conf
DOI :
10.1109/IPFA.2005.1469134
Filename :
1469134
Link To Document :
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