DocumentCode
3549734
Title
Improvement of ageing simulation of electronic circuits based on behavioural modelling
Author
Marc, François ; Mongellaz, Benoît ; Bestory, Corinne ; Lévi, Hervé ; Danto, Yves
Author_Institution
Lab. IXL, Univ. Bordeaux, Talence, France
fYear
2005
fDate
27 June-1 July 2005
Firstpage
195
Lastpage
199
Abstract
In this paper, we will demonstrate how to improve the ageing simulation by the use of a behavioural modelling language like VHDL-AMS, in order to efficiently simulate the reliability of integrated circuit in their electrical context.
Keywords
ageing; circuit simulation; hardware description languages; integrated circuit reliability; VHDL-AMS; ageing simulation; behavioural modelling language; electronic circuits; integrated circuit reliability; Aging; Circuit simulation; Computational modeling; Degradation; Electronic circuits; Hot carriers; MOSFETs; Stress; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the
Print_ISBN
0-7803-9301-5
Type
conf
DOI
10.1109/IPFA.2005.1469160
Filename
1469160
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