Title :
Improvement of ageing simulation of electronic circuits based on behavioural modelling
Author :
Marc, François ; Mongellaz, Benoît ; Bestory, Corinne ; Lévi, Hervé ; Danto, Yves
Author_Institution :
Lab. IXL, Univ. Bordeaux, Talence, France
fDate :
27 June-1 July 2005
Abstract :
In this paper, we will demonstrate how to improve the ageing simulation by the use of a behavioural modelling language like VHDL-AMS, in order to efficiently simulate the reliability of integrated circuit in their electrical context.
Keywords :
ageing; circuit simulation; hardware description languages; integrated circuit reliability; VHDL-AMS; ageing simulation; behavioural modelling language; electronic circuits; integrated circuit reliability; Aging; Circuit simulation; Computational modeling; Degradation; Electronic circuits; Hot carriers; MOSFETs; Stress; Temperature dependence; Voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the
Print_ISBN :
0-7803-9301-5
DOI :
10.1109/IPFA.2005.1469160
