DocumentCode
355009
Title
Subsurface defect detection in ceramic materials using an optical gated scatter reflectometer
Author
Bashkansky, M. ; Duncan, M.D. ; Kahn, M. ; Reintjes, J. ; Battle, Phillip R.
Author_Institution
Laser Phys. Branch, Naval Res. Lab., Washington, DC, USA
fYear
1996
fDate
2-7 June 1996
Firstpage
327
Lastpage
328
Abstract
Summary form only given. We have developed an instrument that is capable of seeing into the subsurface region of most ceramic materials. It is based on optical-coherence-domain reflectometry and uses a low-coherence fiber interferometer.
Keywords
ceramics; fibre optic sensors; flaw detection; light coherence; light interferometry; nondestructive testing; optical images; reflectometry; ceramic materials; low-coherence fiber interferometer; optical gated scatter reflectometer; optical-coherence-domain reflectometry; subsurface defect detection; subsurface region; Ceramics; Light scattering; Mirrors; Optical interferometry; Optical materials; Optical refraction; Optical scattering; Optical sensors; Optical surface waves; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-443-2
Type
conf
Filename
864745
Link To Document