DocumentCode :
355010
Title :
3-D low-coherence imaging for multiple-layer industrial surface analysis
Author :
Seeger, M. ; Podoleanu, Adrian ; Solomon, C.J. ; Jackson, D.A.
Author_Institution :
Phys. Lab., Kent Univ., Canterbury, UK
fYear :
1996
fDate :
2-7 June 1996
Firstpage :
328
Abstract :
Summary form only given. In conclusion, this system may provide useful information about reflecting interface layers inside transparent objects, at micron scale over a virtually unlimited range. In spite of the 8-bit intensity resolution and 56-dB dynamic range of the CCD camera, which theoretically limit the number of detectable air-glass interfaces to about 80, good images have been obtained in both cases. This method could be especially beneficial for applications where the object features are difficult to access by direct physical measurement such as in assessing the surface roughness of a paint layer under a clear lacquer coating.
Keywords :
CCD image sensors; image resolution; industries; light coherence; light interferometry; optical films; surface topography measurement; transparency; 8-bit intensity resolution; CCD camera; clear lacquer coating; detectable air-glass interfaces; direct physical measurement; dynamic range; good images; light interferometry; low-coherence imaging; micron scale; multiple-layer industrial surface analysis; object features; paint layer; reflecting interface layers; surface roughness measurement; transparent objects; Charge coupled devices; Charge-coupled image sensors; Coatings; Dynamic range; Image analysis; Image resolution; Lacquers; Paints; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
Type :
conf
Filename :
864746
Link To Document :
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