Polarization selection in birefringent vertical-cavity surface emitting lasers

Author

Valle, Angel ; Shore, Keith Alan ; Pesquera, Luis

Author_Institution

Dept. de Fisica Moderna, Cantabria Univ., Santander, Spain

fYear

1996

fDate

2-7 June 1996

Firstpage

360

Lastpage

361

Abstract

Summary form only given. Polarisation characteristics of vertical cavity surface-emitting lasers (VCSELs) exhibit significant differences to those of edge-emitting semiconductor lasers. In general the polarization of the fundamental transverse mode can change when the injected current is altered. It has also been noted that the strain induced during the fabrication causes birefringence in VCSELs. In this work we present numerical calculations that demonstrate that small refraction index anisotropies can select the polarization of VCSEL.

Keywords

birefringence; laser cavity resonators; laser modes; laser theory; light polarisation; refractive index; semiconductor device models; semiconductor lasers; surface emitting lasers; birefringence; birefringent vertical-cavity surface emitting lasers; edge-emitting semiconductor lasers; fabrication; fundamental transverse mode; injected current; numerical calculations; polarisation characteristics; polarization selection; small refraction index anisotropies; strain; vertical cavity surface-emitting lasers; Anisotropic magnetoresistance; Birefringence; Capacitive sensors; Laser modes; Optical device fabrication; Optical refraction; Polarization; Semiconductor lasers; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864789