Fullwave analysis of microstrip in-line and offset gaps in fully and laterally open environments using a deterministic spectral domain approach

Author

McLean, J.S. ; Ling, H. ; Itoh, T.

Author_Institution

Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA

fYear

1991

fDate

10-14 July 1991

Firstpage

345

Abstract

Microstrip in-line and offset gap discontinuities in both laterally open and fully open environments are analyzed using a deterministic spectral-domain method. The analysis includes the effects of space-wave and surface-wave radiation and coupling in the case of fully open environments. It also includes the effects of LSM (longitudinal-section magnetic) and LSE (longitudinal-section electric) wave radiation and coupling in the case of laterally open environments. In the case of laterally open environments, the effect of cover height is investigated. The analysis includes the effects of two-dimensional, two-component current flow on the conductors. It is shown that a conducting cover can actually increase overall transmission loss despite preventing space-wave radiation.<>

Keywords

strip lines; waveguide theory; conducting cover; coupling; cover height effect; deterministic spectral domain approach; full-wave analysis; fully open environments; gap discontinuities; in-line gaps; inline gaps; laterally open environments; longitudinal-section electric; longitudinal-section magnetic; microstrip; offset gaps; space-wave radiation; surface-wave radiation; transmission loss; two-component current flow; Conductors; Fourier transforms; Information geometry; Integral equations; Magnetic analysis; Microstrip; Moment methods; Solid modeling; Strips; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1991., IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-87942-591-1

Type

conf

DOI

10.1109/MWSYM.1991.147002

Filename

147002