Title :
Analysis of shielded coplanar waveguide step discontinuity considering the finite metallization thickness effect
Author :
Kuo, C.-W. ; Kitazawa, T. ; Itoh, T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
The mode-matching technique is applied to analyze the shielded coplanar waveguide (CPW) step discontinuity. The effect of the finite thickness of the CPW center strip and ground planes is also considered. Results on the frequency-dependent scattering parameters of the shielded CPW step discontinuity incorporating the finite metallization thickness effect are presented.<>
Keywords :
waveguide components; waveguide theory; finite metallization thickness effect; frequency-dependent scattering parameters; ground planes; mode-matching technique; shielded coplanar waveguide; step discontinuity; Circuits; Coplanar waveguides; Electromagnetic waveguides; Finline; Frequency; MMICs; Metallization; Scattering parameters; Strips; Waveguide discontinuities;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.147039
