Title :
Characterization of microwave integrated circuits using an optical phase-locking and sampling system
Author :
Hung, H.-L.A. ; Li, M.G. ; Huang, S.-l.L. ; Lee, C.H.
Author_Institution :
COMSAT Lab., Clarksburg, MD, USA
Abstract :
Using an optical technique, phase-locked microwave signals of up to 15 GHz from voltage-controlled oscillators have been achieved. Combining this technique with a photoconductive switch, a novel microwave waveform sampling system that displays the characteristics of oscillators and amplifiers has been demonstrated. The approach has potential applications for optically phase-locked microwave subsystems and monolithic integrated circuit characterizations.<>
Keywords :
MMIC; microwave measurement; phase-locked loops; photoconducting devices; semiconductor switches; variable-frequency oscillators; 15 GHz; PLL; SHF; VCO; microwave integrated circuits; microwave waveform sampling system; optical phase-locking; optically phase-locked microwave subsystems; phase-locked microwave signals; photoconductive switch; sampling system; voltage-controlled oscillators; waveform measurement; Displays; Integrated optics; Microwave integrated circuits; Microwave theory and techniques; Optical switches; Photoconductivity; Photonic integrated circuits; Sampling methods; Stimulated emission; Voltage-controlled oscillators;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.147048
