Title :
Accurate characterization of cross-over and other junction discontinuities in two-layer microstrip circuits
Author :
Hoorfar, A. ; Zheng, J.X. ; Chang, D.C.
Author_Institution :
Dept. of Electr. Eng., Villanova Univ., PA, USA
Abstract :
A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four-port and three-port junctions are characterized by applying a Galerkin method with linear basis functions for the currents. Numerical results are presented.<>
Keywords :
microwave circuits; strip lines; waveguide couplers; Galerkin method; coupling effects; cross-over; four-port junctions; junction discontinuities; linear basis functions; mixed-potential spatial-domain integral equation; three-port junctions; two-layer microstrip circuits; Boundary conditions; Conductors; Coupling circuits; Fabrication; Green´s function methods; Integral equations; Microstrip antenna arrays; Microstrip antennas; Moment methods; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.147079
