Title :
Research on the ablation characteristics and increasement of electrical conductivity of C/sub 60/ film by 308-nm excimer laser
Author :
Qihong Lou ; Dong Ning ; Jinxin Dong ; Yunrong Wei
Author_Institution :
Inst. of Opt. & Fine Mech., Acad. Sinica, Shanghai, China
Abstract :
Summary form only given. The C/sub 60/ film samples were irradiated in air by XeCl laser. The sheet conductivities were determined by measuring the resistance between the two electrodes and plotted as a function of the number of laser shots. These data show an increase in conductivity of over, six orders of magnitude. Finally, the Raman spectroscopy and STM images of these laser-irradiated fullerene surface are presented.
Keywords :
Raman spectra; carbon; electrical conductivity measurement; fullerenes; laser ablation; optical films; scanning tunnelling microscopy; 308 nm; C; C/sub 60/ film; Raman spectroscopy; STM images; XeCl; XeCl laser; ablation characteristics; electrical conductivity measurement; electrodes; laser shots; laser-irradiated fullerene surface; nm excimer laser; sheet conductivities; Atomic layer deposition; Chemical lasers; Chromium; Conductivity; Gas lasers; Optical pulses; Pulsed laser deposition; Substrates; Surface emitting lasers; Temperature;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
