Research on the ablation characteristics and increasement of electrical conductivity of C/sub 60/ film by 308-nm excimer laser

Author

Qihong Lou ; Dong Ning ; Jinxin Dong ; Yunrong Wei

Author_Institution

Inst. of Opt. & Fine Mech., Acad. Sinica, Shanghai, China

fYear

1996

fDate

2-7 June 1996

Firstpage

426

Lastpage

427

Abstract

Summary form only given. The C/sub 60/ film samples were irradiated in air by XeCl laser. The sheet conductivities were determined by measuring the resistance between the two electrodes and plotted as a function of the number of laser shots. These data show an increase in conductivity of over, six orders of magnitude. Finally, the Raman spectroscopy and STM images of these laser-irradiated fullerene surface are presented.

Keywords

Raman spectra; carbon; electrical conductivity measurement; fullerenes; laser ablation; optical films; scanning tunnelling microscopy; 308 nm; C; C/sub 60/ film; Raman spectroscopy; STM images; XeCl; XeCl laser; ablation characteristics; electrical conductivity measurement; electrodes; laser shots; laser-irradiated fullerene surface; nm excimer laser; sheet conductivities; Atomic layer deposition; Chemical lasers; Chromium; Conductivity; Gas lasers; Optical pulses; Pulsed laser deposition; Substrates; Surface emitting lasers; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-443-2

Type

conf

Filename

864876