A combination of FD-TD and Prony´s methods for analyzing microwave integrated circuits

It is demonstrated that, in applying the FD-TD (finite-difference time-domain) technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency-domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony´s method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony´s methods achieves the same accuracy with a time record computed over a much shorter time.<>