Title :
Highly sensitive measurements with a lens-focused reflectometer
Author_Institution :
US Naval Weapons Center, China Lake, CA, USA
Abstract :
A lens-focussed microwave reflectometer that offers exceptional sensitivity and very wide bandwidth is described. The system produces a well-confined spot focus and, with the prescribed calibration procedure, gives effective directivity approaching 70 dB. Precision of +or-1 dB is demonstrated for measurements in X-band at the -50 dB level.<>
Keywords :
calibration; focusing; microwave reflectometry; X-band; calibration procedure; lens-focused reflectometer; microwave reflectometer; spot focus; wide bandwidth; Antenna measurements; Calibration; Dielectric measurements; Equations; Flow graphs; Frequency measurement; Optical films; Optical reflection; Reflectivity; Wavelength measurement;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.147184
