DocumentCode
3551481
Title
Highly sensitive measurements with a lens-focused reflectometer
Author
Gagnon, D.R.
Author_Institution
US Naval Weapons Center, China Lake, CA, USA
fYear
1991
fDate
10-14 July 1991
Firstpage
1017
Abstract
A lens-focussed microwave reflectometer that offers exceptional sensitivity and very wide bandwidth is described. The system produces a well-confined spot focus and, with the prescribed calibration procedure, gives effective directivity approaching 70 dB. Precision of +or-1 dB is demonstrated for measurements in X-band at the -50 dB level.<>
Keywords
calibration; focusing; microwave reflectometry; X-band; calibration procedure; lens-focused reflectometer; microwave reflectometer; spot focus; wide bandwidth; Antenna measurements; Calibration; Dielectric measurements; Equations; Flow graphs; Frequency measurement; Optical films; Optical reflection; Reflectivity; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-87942-591-1
Type
conf
DOI
10.1109/MWSYM.1991.147184
Filename
147184
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