Novel truncated cone cavity for surface resistance measurements of high T/sub c/ superconducting thin films

Author

Mayer, B. ; Knochel, R. ; Reccius, A.

Author_Institution

Arbeitsbereich Hochfrequenztech., Tech. Univ., Hamburg-Harburg, Germany

fYear

1991

fDate

10-14 July 1991

Firstpage

1019

Abstract

A truncated cone cavity that avoids degeneration between the TE/sub 01n/ and TM/sub 11n/ modes occurring in the most frequently used circular cylindrical cavities for materials measurements is described. Analytical expressions for the field components are given. An error analysis is carried out which yields a sensitivity of 2.3 m Omega for surface resistance measurements at 18 GHz, using samples with a diameter of 9 mm. One cavity was built, and measurement results are given for the surface resistance of various YBa/sub 2/Cu/sub 3/O/sub x/ thin films on MgO substrates. The samples were manufactured by means of laser ablation and magnetron sputtering.<>

Keywords

cavity resonators; electric resistance measurement; high-temperature superconductors; measurement errors; microwave measurement; superconducting thin films; 18 GHz; MgO substrates; SHF; TE/sub 01n/ mode; TM/sub 11n/ modes; YBa/sub 2/Cu/sub 3/O/sub x/-MgO; error analysis; field components; high T/sub c/ superconducting thin films; materials measurements; surface resistance measurements; truncated cone cavity; Electrical resistance measurement; Error analysis; Magnetic field measurement; Resonance; Shape measurement; Sputtering; Superconducting microwave devices; Superconducting thin films; Surface resistance; Tellurium;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1991., IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-87942-591-1

Type

conf

DOI

10.1109/MWSYM.1991.147185

Filename

147185