16-term error model and calibration procedure for on wafer network analysis measurements (MMICs)

Author

Butler, J.V. ; Rytting, D. ; Iskander, M.F. ; Pollard, R. ; Vanden Bossche, M.

Author_Institution

Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA

fYear

1991

fDate

10-14 July 1991

Firstpage

1125

Abstract

A calibration procedure that includes all of the possible errors in an open air fixture such as an MMIC (monolithic microwave integrated circuit) device is discussed. In the case of a two-port network, this extends to 16 terms. The 16-term model will allow fixtures with poor grounding and numerous cross-talk paths to be accurately calibrated. The theory and methods used to solve the 16-term error model system, as well as results obtained from this model, are investigated. Corrected measurements using the new 16-term calibration procedure were compared with TRL calibration measurements and excellent agreement was observed.<>

Keywords

MMIC; calibration; integrated circuit testing; measurement errors; microwave measurement; 16-term model; MMIC; calibration procedure; error model; monolithic microwave integrated circuit; on wafer network analysis measurements; onwafer technique; open air fixture; two-port network; Calibration; Cities and towns; Current measurement; Electric variables measurement; Equations; Fixtures; MMICs; Probes; Semiconductor device modeling; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1991., IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-87942-591-1

Type

conf

DOI

10.1109/MWSYM.1991.147214

Filename

147214