Abstract :
A new einzel lens has been developed to focus and "microscan" (or deflect by relatively small amounts) high voltage electron beams by means of low voltage deflecting electrodes. This development represents an important advance with respect to the presently known electron guns requiring auxiliary coils or high voltage deflecting electrodes for beam microscanning purposes. Widespread applications in the fields of high definition black and white compatible television, television scanning line structure suppression, etc. appear to be made possible by this device.
