Title :
High-speed, high-current P-N-P and N-P-N drift transistors
Author :
Beatty, H.J. ; Swanson, R.E.
Abstract :
The techniques involved in high-speed drift transistors have been extended to provide p-n-p and n-p-n transistors for high-speed, high-current applications. Although the specific design objective was a device useful in core-driving applications, the resulting device will be useful in many high-current, high-voltage applications. The basic structure consists of an alloy emitter, graded base and graded collector. The specific core-driving application considered required the transistor to switch currents in the range of one-half ampere with transition times of less than 50 µsec. The collector voltage and repetition rates are such that the device must be capable of dissipating several watts.
Keywords :
Circuit testing; Hafnium; Impurities; Performance gain; Production; Silicon; Switches; Temperature; VHF circuits; Voltage;
Conference_Titel :
Electron Devices Meeting, 1957 International
DOI :
10.1109/IEDM.1957.187074