• DocumentCode
    3551842
  • Title

    Planar silicon diodes and transistors

  • Author

    Hoerni, J.A.

  • Volume
    6
  • fYear
    1960
  • fDate
    1960
  • Firstpage
    50
  • Lastpage
    50
  • Abstract
    In the planar design of diodes or transistors, the device is fabricated to its final shape during the diffusion operations, rather than during a mesa operation subsequent to diffusion. The planar process involves the application of a suitable coating on the silicon surface prior to the diffusion operations so that the junctions emerge from the bulk of the material under the coating and are protected from environmental contamination. Two types of devices made by the process will be described: a planar diode and a planar NPN transistor. Dopants used in both cases are boron and phosphorus and the lateral limitation of the diffused layers is obtained by oxide masking of suitable shape. The outstanding property of planar units is the very tight distribution of diode reverse currents over a large sample of units. Values of these currents are in close agreement with those calculated from bulk reverse currents. Life test data indicate improved reliability at high temperature storage over mesa units of similar characteristics. Data on unencapsulated units will also be presented.
  • Keywords
    Boron; Coatings; Fabrication; Impurities; Life testing; Oscillators; Semiconductor diodes; Shape; Silicon; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1960 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1960.187178
  • Filename
    1472833