DocumentCode :
3552000
Title :
Silicon planar integrated circuitry - Using a unique combination of multi-layer epitaxial and diffusion techniques
Author :
Boerger, F.E. ; Martel, C.S. ; Robertson, H.M.
Author_Institution :
Westinghouse Electric Corp., Newbury Park, Calif.
fYear :
1962
fDate :
25-27 Oct. 1962
Firstpage :
32
Lastpage :
32
Abstract :
A combination of multi-layer epitaxial growth and selective diffusion was successfully used to fabricate electrically isolated active devices on a single chip of silicon. Four, layer silicon epitaxial growth is used in our present devices. Electrical isolation of multi-layer structures can be obtained by making impurity depositions at the junctions, or within epitaxial layers. For example, two epitaxial layers can be isolated in the following way. A p-type deposition is placed on a p-type substrate. Two epitaxial layers are then grown first, n-type, and then p-type, after which, an n-type deposition is placed on the surface. This technique is, of course, not limited to isolating epitaxial layers. The ability to work within the solid offers new design freedom. For example, reverse impurity profiles can be readily obtained.
Keywords :
Circuits; Conductivity; Epitaxial growth; Epitaxial layers; Etching; Impurities; Silicon; Solids; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1962 International
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/IEDM.1962.187292
Filename :
1473319
Link To Document :
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