• DocumentCode
    3552108
  • Title

    Design of silicon oxide variable capacitor

  • Author

    Delord, J.F. ; Hutchins, T. ; Stringer, G.

  • Author_Institution
    Tektronix, Inc., Beaverton, Oregon
  • Volume
    9
  • fYear
    1963
  • fDate
    1963
  • Firstpage
    32
  • Lastpage
    32
  • Abstract
    Silicon-silicon oxide-metal capacitors have been developed and studied in view of their applications to reactance amplifiers. Desirable characteristics are: 1. Large dc/dv. 2. Symmetrical C-V characteristic at zero bias. 3. Low spreading Rs. 4. Low leakage current. Devices with symmetric characteristics at Zero bias, 1 dc/C dv better than one per volt, good linearity over 50 percent of the capacitance range, and overall capacitance ratios several hundred to one will be described. Important parameters are (1) the quality of the oxide which affects both symmetry and leakage current; (2) the choice of the counter electrode metal, which is responsible for a shift in quiescent bias (alloys can be used for intermediate voltages); (3) the base material itself and oxide thickness which determines minimum and maximum capacitance. Most difficult control to achieve is that of the surface states at the silicon-oxide interface. They are affected by the base material, the condition of oxide growth and the center electrode material. Special techniques, and in particular, oxid doping, have been used and long range stability has been achieved with some treatments. Results of tests in actual circuit, variation of characteristics with frequency, effect of temperature and light, as well as observations on aging will be presented.
  • Keywords
    Capacitance; Capacitance-voltage characteristics; Capacitors; Circuit testing; Counting circuits; Electrodes; Leakage current; Linearity; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1963 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1963.187370
  • Filename
    1473595