Title :
Minority carrier lifetime control in the gate-controlled switch
Author :
Windecker, Roland T. ; Hahn, Larry A. ; Harding, Marvin L.
Author_Institution :
Texas Instruments Inc., Dallas, Texas
Abstract :
This paper discusses methods of controlling the turn-off gain of the gate-controlled switch. Goldey has shown that the turn-off gain of a gate-controlled switch can be given by β = α1α1+α2-1 where α1and α2represent the current gain across the gated and ungated base layers. If the minority carrier lifetime of the n-base layer is adjusted so that α2is slightly larger than 1 - α1the turn-off gain will be high.
Keywords :
Charge carrier lifetime; Conductivity; Doping; Gold; Instruments; Manufacturing; Neutrons; Process control; Switches; Temperature;
Conference_Titel :
Electron Devices Meeting, 1964 International
DOI :
10.1109/IEDM.1964.187475