Title :
Impedance and noise characteristics of a microwave amplifier using avalanche diodes
Author :
Josenhans, J.G. ; Misawa, Tetsuya
Abstract :
Room Temperature microwave measurements have been made using an epitaxial silicon p n n + avalanche diode in continuous operation. The diode is believed to have a somewhat distributed avalanche throughout the depletion layer as contrasted to the Read model in which the avalanche is confined to a narrow zone within the depletion layer. The difference between the models, for the small signal case, appears to be distinguishable from the diode´s microwave impedance characteristics.
Keywords :
Charge carrier processes; Diodes; Frequency; Impedance; Laboratories; Microwave amplifiers; Microwave measurements; Noise figure; Semiconductor process modeling; Silicon;
Conference_Titel :
Electron Devices Meeting, 1965 International
DOI :
10.1109/IEDM.1965.187515