Title :
SPLIT circuit model for test generation
Author_Institution :
AT&T Eng. Res. Center, Princeton, NJ, USA
Abstract :
A novel circuit model, SPLIT, is presented which is a modified 9-valued circuit model. SPLIT has the precision of the 9-valued model and the simplicity of the 5-valued model. So that its D-algorithm has better performance than that of the 5-valued or the 9-valued model
Keywords :
automatic test equipment; logic testing; D-algorithm; SPLIT circuit model; automatic test generation; modified 9-valued circuit model; precision; simplicity; test generation; Circuit faults; Circuit testing; Combinational circuits; Decision making; Labeling; Sequential analysis; Sequential circuits;
Conference_Titel :
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-0864-1
DOI :
10.1109/DAC.1988.14741
