DocumentCode
3552287
Title
SPLIT circuit model for test generation
Author
Cheng, Wu-Tung
Author_Institution
AT&T Eng. Res. Center, Princeton, NJ, USA
fYear
1988
fDate
12-15 Jun 1988
Firstpage
96
Lastpage
101
Abstract
A novel circuit model, SPLIT, is presented which is a modified 9-valued circuit model. SPLIT has the precision of the 9-valued model and the simplicity of the 5-valued model. So that its D-algorithm has better performance than that of the 5-valued or the 9-valued model
Keywords
automatic test equipment; logic testing; D-algorithm; SPLIT circuit model; automatic test generation; modified 9-valued circuit model; precision; simplicity; test generation; Circuit faults; Circuit testing; Combinational circuits; Decision making; Labeling; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
0-8186-0864-1
Type
conf
DOI
10.1109/DAC.1988.14741
Filename
14741
Link To Document