DocumentCode :
3552372
Title :
Thermal switchback in high ftepitaxial transistors
Author :
Steffe, Walter
Volume :
11
fYear :
1965
fDate :
1965
Firstpage :
47
Lastpage :
48
Abstract :
Maximum power dissipation of transistors is limited by a thermal switchback of the VCEresulting often in a complete melting of a small area of the device even under conditions of maximum thermal conduction between collector junction and case. This thermal switchback occurs when an isolated area of the transistor, because of normal random variations of electrical behavior, or of non-uniform electrical conductivity, or of a physical defect, draws higher currents than other regions; this increase in current density will heat the small area; the VBE, having a negative temperature coefficient, will decrease. As a result IBwill increase followed by a much larger increase in IC. This rapid heating avalanche will cause the thermal runaway and eventually a burning out of the isolated area.
Keywords :
Avalanche breakdown; Current density; Electric breakdown; Germanium alloys; Heating; Integrated circuit modeling; Power semiconductor switches; Surface treatment; Thermal conductivity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1965 International
Type :
conf
DOI :
10.1109/IEDM.1965.187596
Filename :
1474177
Link To Document :
بازگشت