Title :
Noise in injected-beam crossed-field electron devices
Author :
Lele, S.G. ; Rowe, J.E.
Author_Institution :
The University of Michigan, Ann Arbor, Mich.
Abstract :
The purpose of this paper is to present some theoretical and experimental results on noise transport in crossed-field devices which utilize Kino type electron guns. The noise characteristics of several types of guns are compared and the results contribute to a better understanding of the various problems associated with noise in injected-beam crossed-field devices. The Monte Carlo method is used to simulate random electron emission from the cathode in terms of so-called "big electrons." The big electrons are randomly generated at the cathode at prescribed times according to a Poisson distribution A half-Maxwellian distribution is assumed for the normal velocity component and a full-Maxwellian distribution for the tangential velocity component.
Keywords :
Bandwidth; Cathodes; Computer simulation; Contracts; Electron devices; Electron emission; Electron guns; Fluctuations; Gain; Integrated circuit noise;
Conference_Titel :
Electron Devices Meeting, 1966 International
DOI :
10.1109/IEDM.1966.187642