Title :
A process for ceramic dielectric isolation for integrated circuits
Author :
Ramsey, Thomas H. ; Smith, Tim
Author_Institution :
Texas Instruments, Inc., Dallas, Texas.
Abstract :
A process for dielectric isolation has been developed which is capable of providing integrated circuits with operational characteristics similar to those of discrete components. The technique makes use of a backside etch with a ceramic filled isolation medium. Life, thermal and shock tests have indicated no detrimental effects from the isolating cement. A total of 1035 logic block and gated latch devices have been supplied for Redman (NSA) and have given very successful results. The yield based on the present process is about 9% and cost studies have indicated that the Redman type device should cost about $2.66 to manufacture.
Keywords :
Ceramics; Circuit testing; Costs; Dielectrics; Electric shock; Etching; Latches; Life testing; Logic devices; Logic gates;
Conference_Titel :
Electron Devices Meeting, 1966 International
DOI :
10.1109/IEDM.1966.187694