DocumentCode
3552540
Title
Recent developments in research on metal-insulator-piezoelectric semiconductor transducers
Author
Muller, R.S. ; Fiebiger, J.R.
Volume
12
fYear
1966
fDate
1966
Firstpage
100
Lastpage
102
Abstract
The theory underlying the operation of metal-insulator-piezoelectric semiconductor (MIPS) electromechanical transducers is verified experimentally for time-varying loads on devices made from CdS piezoelectric film materials. Experimental transducers exhibit sensitivities of the same order as those observed under static loading within times shorter than one microsecond after the application of mechanical stress. Tests of the structures under hydrostatic pressure further corroborate MIPS theory. The frequency limitations for the transducer appear to be determined by the electrical properties of the MOS structure. The MIPS effect is demonstrated experimentally in CdSe transducers. Transducers fabricated on a flexible polyimide film are described, and a microphone embodying this construction is discussed.
Keywords
Frequency; Inorganic materials; Metal-insulator structures; Piezoelectric films; Piezoelectric materials; Piezoelectric transducers; Polyimides; Semiconductor materials; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1966 International
Type
conf
DOI
10.1109/IEDM.1966.187723
Filename
1474562
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